Interpretation and Theory

Electronic excitation of the Rhodium target within the XRF-Gun produces a beam of x-rays directed towards the bulk material sample.

Pulling the trigger of the XRF gun generates an x-ray beam that is generated at the sample.

The x-ray beam penetrates the sample anywhere from 10-100μm into the surface.

Due to the high energy of the x-ray beam, the atoms of the sample become excited.

This excitation causes inner shell electrons to eject from their orbitals (photoelectron production).

Upon returning to their relaxed state, the previously excited atoms release x-ray photons.

The energy of these photons correspond with electron energy differences present in the atoms.

The energy differences in each elements' atoms are unique and also known by the scientific community.

The XRF gun reads the energy levels of the x-ray photons using a Silicon Drift Detector (SDD).

When the photons enter the SDD they begin to form electron-pairs with the atoms inside.

The electrons and holes from this process are then collected by the oppositely charged walls of the SDD

The electronic programming of the SDD then counts these atoms and holes and records the energy levels of each one.

The data from this process is used to generate a plot displaying the photon beam intensity (y-axis) versus the energy of the photon beam (x-axis).

The energy levels are used to identify individual elements in the sample material and the intensity levels correspond with the total amount of the element present.

Along with the energy plot, the XRF gun will produce the numerical chemical composition of the sample (in weight percent).

For both "Pass/Fail" and "Analysis" the Configuration settings should be set as follows:

Analysis Type - Auto

Test Params - Timed

Library - Standard

Click "here" to return to Step 6 of the "How To" guide.