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A hot tungsten filament emits electrons.
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The acceleration potential, 5-40kV, set by the user causes the W photoelectrons to strike the target with 5-40 keV energy.
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The high energy electrons cause the target, typically Cu, to emit characteristic x-rays; these serve as the x-ray diffraction beam.
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Water cycles through the system to cool the metal anode target.
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The source emits x-rays that can be approximated as plane waves as they encounter the sample.
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X-rays diffract through the interatomic spacing of the crystal lattice and produce a diffraction pattern of new x-rays.
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New x-rays interfere and can be assumed to be plane waves when they reach the x--ray detector.
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Only x-rays that exhibit constructive interference as described by the Bragg Condition will be detected. All other x-rays waves destructively interfere.
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This image depicts Laue diffraction, a configuration for transmission diffraction. The diffractometer has a different geometric layout.
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The geometry of our system is called "theta/theta" to indicate that the incoming x-ray angle = diffraction angle=theta.
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This scan mode is "Locked-Coupled" to indicate a locked and coupled positions of the x-ray tube and detector.
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In theta/theta geometry, only planes parallel to the specimen surface will give rise to x-ray diffraction.
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Incident x-rays penetrate the sample and induce scattered x-rays from each electron. The scattered waves that add constructively are also those that meet the Bragg condition. They are called "Reflections."
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Bragg's condition: n is an integer, d is the interplanar spacing, lambda is the wavelength, theta is the angle between the incident vector and vector normal to the plane.
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Constructive interference occurs only when the path length difference between parallel planes of atoms is equal to integer multiples of the wavelength of incident x-rays.
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All other scattered x-rays destructively interfere.
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Powder samples ideally have an equal distribution of randomly oriented crystals.
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Only planes parallel to the surface will diffract in a locked-coupled scan. If your specimen is neither powder nor randomly-oriented, the relative intensities will not match the library patterns.
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For each peak, only certain orientations of crystal planes will produce constructive interference.
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Use this formula for cubic lattices to calculate the lattice parameter, peaks, or composition of the sample. h, k, and l refer to the Miller indices of the diffracting plane. a is the lattice parameter.
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